Band Gap Measurement of CdTe, ZnTe AND CdZnTe II-VI Semiconducting Sintered Films: A Review

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Dr. Seema Teotia

Abstract

The sintered films configurations of ternary alloy of Cd, Zn and Te are emerging as an important class of material for optoelectronics applications due to their flexible electrical and optical properties. CdTe, ZnTe and CdZnTe are some of the very important II-VI semiconductor compounds. Ternary compounds are one option to vary the band gap of semiconductors almost continuously over a wide energy range. This method is highly dependent on the materials as well as the growth techniques. Especially materials with very different lattice constants or different crystal phases (wurtzite or zincblende in this case) are difficult to combine. Tensions and impurities due to low crystal quality result in low optoelectronic properties. Basically, it is possible to gain any band gap between those of the two materials. Consequently, it is possible to choose very specifically the wavelength of photons emitted by laser diodes or light emitting diodes.

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Dr. Seema Teotia. (2016). Band Gap Measurement of CdTe, ZnTe AND CdZnTe II-VI Semiconducting Sintered Films: A Review. Research Inspiration, 1(III), 159–165. Retrieved from http://www.researchinspiration.com/index.php/ri/article/view/205
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References

C. F. Klingshirn, B. K. Meyer, A. Waag, A. Hoffmann, J.Geurts: Zinc oxide From Fundamental Properties Towards Novel Applications Springer Series in Materials Science Vol. 120, Springer, Heidelberg u. a. 2010, ISBN: 978-3-642-10576-0(Print) 978-3-642-10577-7 (Online).

D.W. Palmer, “Properties of the II-VI compound Semiconductor”, www.semiconductors.co.uk. 2008.03 (Retrieved 11 September 2015).

M.S. Shaalan, J. Muller, Solar cells 28(1990) 185-.192.

G K M Thutupalli and S G Tomlin J. Phys., D:Appl. Phys. 9 (1976), 1639-1646.

M. Jain, (Ed). II-VI Semiconductor Compounds, World Scientific, 1993.

R. Bhargava, (Ed). Properties of Wide Band gap II-VI Semiconductors. Inspec, 1997.

A. Rohatgi,, S.A. Ringel, R. Sudharsanan, P.V. Meyers, C.H. Liu, V. Ramanathan, Solar Cells 27 1989: 219 – 230.

P.K. Kalita, B,K. Sarma, H.L. Das, Indian Journal of Pure and Applied Physics 37 1999: pp. 885 – 890.

A.K.S. Aqili,Z. Ali, A. Mazsood, Applied Surface Science 167 2000: pp. 1 – 11. http://dx.doi.org/10.1016/S0169-4332(00)00498-0111.

M.R.H. Khan, Interface, Journal Physics, D:Applied Physics 27 1994: 2190 – 2193. http://dx.doi.org/10.1088/0022-3727/27/10/031

W.I. Tao, M. Jurkovic, I.N. Wang, Applied Physics Letter 64 1994: 1848 – 1849.

G.I. Rusu, P. Prepelita, N. Apetroaei, G, Popa J. of Optoelectronics and Advanced Material 7 (2) 2005: 829 – 835.

T. Mahalingam, V.S. John, S. Rajendran, G. Ravi, P.J. Sebastian, Surface Coatings Technology 155 2002: 45 – 249.

S.Teotia, Research Ambition - An International Multidisciplinary e-Journal, ISSN : 2456-0146,(2016)207-211.

S. Adachi, Properties of Semiconductor Alloys: Group-IV, III–V and II–VI Semiconductors Gunma University, Gunma, Japan.

S. Teotia, T.P. Sharma, S.C.K. Mishra, SPIE, 1999, Vol. 3903, 298-304.

S.Teotia, J. of Scientific and Applied Research, ISSN :0975 – 9743,(Jan 2015) 21-22.

J. Tauc Ed., Amorphous and Liquid Semiconductors, Plenum,New York, 1974, 159.

S.K. Sharma, V. Kumar, S. Sirohi, T.P. Sharma, C.S.I.O. 4(3), (1996), 189-191.

S. Sirohi, V. Kumar, T.P. Sharma, J. of Optical Material, 12(1999),121-125.

S Sirohi, T.P Sharma, J. of Optical Material, 13(1999), 267-269.

S. Sirohi, V. Kumar, V. Kumar, T.P. Sharma, Semiconductor materials, R.K. Bedi (Ed.) 1998, 91-94.

S. Sirohi, V.K. Sharma, T.P. Sharma, C.S.I.O. 6(2), (1998). 95-99.

S. Sirohi, V. Kumar, T.P. Sharma, ICOL-98, Optics and Optoelectronics, Narosa Publication, 1361-1363.

S. Sirohi, T.P. Sharma, ICAM-2000, SM-43.

S. Sirohi, T.P. Sharma, CONIAPS – VIII, December 2005, PH- 63.

S. Sirohi, T.P. Sharma, ISOAP – 2006 February,6.